Keynote Speakers Details

Dakshina Ranjan Kisku is currently an Associate Professor in the Department of Computer Science and Engineering at National Institute of Technology Durgapur, India. He received his BCSE, MCSE and Ph.D. (Engineering) degrees in Computer Science and Engineering from Jadavpur University, India. He also obtained MS in Data Science from the University of East London. Dr. Kisku is an active researcher in the areas of biometrics, image processing, computer vision, machine learning and deep learning. He was a Researcher in the Computer Vision Lab at the University of Sassari, Italy, from March 2006 to March 2007. Prior to that, he was a Project Associate in the Biometrics and Computer Vision Lab at the Indian Institute of Technology Kanpur, India. He was a Postdoctoral Scientist in the Signal Processing Laboratory at Bahcesehir University, Turkey, in 2012. Prior to joining NIT Durgapur, he was working as a faculty member for several years at Asansol Engineering College, India and Dr. B. C. Roy Engineering College, India. Dr. Kisku has more than 140 scientific publications to his credit published in refereed conferences, journals and edited books. He has co-authored and edited three books on biometrics and homeland security and one book on medical biometrics. He has published two patents in the area of Public Healthcare. He is a recipient of IEI Young Engineers Award, IEI Excellence Award, Outstanding Scientist Award, Outstanding Reviewers Awards, EARG Award, IEEE Travel Award, IAPR/IEEE Endorsement Scholarship, MIUR Research Fellowship, TUBITAK PDF Fellowship, Visvesvaraya Fellowship, and many other accolades. Dr. Kisku is a Fellow of RSPH, UK, Fellow of IEI, and Senior Member of IEEE (USA). He is a Chartered Engineer (I) of the The Institution of Engineers (India). He is a Principle Member of LITD 32 Biometrics Sectional Committee under BIS and also serves as an External Expert member of ISO. He regularly serves as a member of the technical committee for many conferences and also as a reviewer for many refereed journals, conferences, and books.